object micrometer
英 [ˈɒbdʒɪkt maɪˈkrɒmɪtə(r)]
美 [ˈɑːbdʒekt maɪˈkrɑːmɪtər]
物镜测微计
双语例句
- A new scanning ion beam ( SIB) moir é method is proposed to measure the in plane deformation of object in a micrometer scale.
提出了一种在微米尺度下测量物体面内位移的新型扫描离子束云纹法。